Discrete Device Tester

Brand: Huake Zhiyuan
Name: Transistor Curve Tracer Discrete Device Tester
Model: HUSTEC-DC-2020
Application: Testing diodes, transistors, MOSFETs, IGBTs, thyristors, silicon-controlled rectifiers, etc.

The device has strong expandability; voltage, current, and test variety ranges can be enhanced through optional accessories. Under PC window prompts, input the test conditions of the device under test and click to complete the testing task. The system uses test sockets with a Kelvin sensing structure to automatically compensate for any voltage drops caused by the system internals and test cable length, ensuring accurate and reliable test results.

The panel display device promptly shows various working statuses and test results of the system, and the function keys on the front panel facilitate system operation. Through these function keys, the system can perform multiple tasks independently without the host computer.

The system provides interfaces for connecting to robots, probe stations, and computers, supporting the interconnection and use of various auxiliary equipment.

Product Introduction



The product features a desktop structure designed for tabletop placement, consisting of two main parts: the test host and the programmable computer. With external fixtures and adapters, it can also connect to sorters and robots via optional Prober and Handler interfaces (16Bin) to establish a workstation, enabling rapid batch testing. Software settings allow automatic classification and storage based on the parameter grades of the devices under test. It is well-suited for various scenarios such as "Incoming Inspection," "Failure Analysis," "Selection and Matching," and "Mass Production Testing."

The product demonstrates excellent performance in reliability, repeatability of test data, and testing efficiency. The innovative "point-control fixture" allows operators to perform tests with a single touch on the fixture, making operation simpler and more efficient. Test data can be saved as Excel files.



Application Scenarios



Ø Test Analysis (Initial testing during the R&D and design phase of power devices)

Ø Failure Analysis (Testing and analyzing failed devices to identify failure mechanisms, facilitating improvements in the overall design and usage process of electronic equipment)

Ø Selection and Matching (Conducting comprehensive tests before devices are soldered onto circuit boards, classifying and pairing devices with consistent test data)

Ø Incoming Inspection (Sampling/full inspection of incoming devices by quality departments (IQC) of research institutes and electronic factories to control device yield rates)

Ø Mass Production Testing (Connecting to various auxiliary mechanical equipment such as robots, barcode scanners, and sorters to achieve规模化、自动化测试)




Product Features



(1) Capable of testing 7 major categories and 26 subcategories of electronic components;

(2) PC serves as the main control unit of the system;

(3) Software interface with fill-in menus developed based on the LabVIEW platform;

(4) Automatic identification of device polarity NPN/PNP (5) 16-bit ADC, 100K/S sampling rate;

(6) Programmable high-voltage source 10~1400V, with optional 2KV configuration;

(7) Programmable high-current source 1uA~40A, with optional 100A, 300A, 500A configurations;

(8) Drive voltage 10mV~40V;

(9) Control electrode current 10uA~10mA;

(10) Four-wire Kelvin connection ensures accuracy in loading and measurement;

(11) Calibration via RS232 interface connected to a calibration digital multimeter;

(12) Optional Prober and Handler interfaces (16Bin)

(13) Provides users with a wide range of test adapters

(14) Maximum test capacity when connected to a sorter: 10,000 units per hour

(15) Capable of testing junction capacitance, such as Cka, Ciss, Crss, Coss;

(16) Pulse current automatic heating function facilitates high-temperature testing without external heating devices;



Test Parameters



(1) Diode category: Diode

Kelvin, Vrrm, Irrm, Vf, △Vf, △Vrrm, Cka, Tr (optional);

(2) Diode category: Zener Diode (ZD)

Kelvin, Vz, lr, Vf, △Vf, △Vz, Roz, lzm, Cka;

(3) Diode category: Zener Diode (ZD)

Kelvin, Vz, lr, Vf, △Vf, △Vz, Roz, lzm, Cka;

(4) Diode category: Three-terminal Schottky Barrier Diode (SBD)

Kelvin, Type_ident, Pin_test, Vrrm, Irrm, Vf, △Vf, V_Vrrm, I_Irrm, △Vrrm, Cka, Tr (optional);

(5) Diode category: Transient Voltage Suppressor (TVS)

Kelvin, Vrrm, Irrm, Vf, △Vf, △Vrrm, Cka;

(6) Diode category: Rectifier Bridge

Kelvin, Vrrm, Irrm, Ir_ac, Vf, △Vf, △Vrrm, Cka;

(7) Diode category: Three-phase Rectifier Bridge

Kelvin, Vrrm, Irrm, Ir_ac, Vf, △Vf, △Vrrm, Cka;

(8) Transistor category: Transistor

Kelvin, Type_ident, Pin_chk, V(br)cbo, V(br)ceo, V(br)ebo, Icbo, lceo, Iebo, Hfe, Vce(sat), Vbe(sat), △Vsat, △Bvceo, △Bvcbo, Vbe, lcm, Vsd, Ccbo, Cces, Heater, Tr (optional), Ts (optional), Value_process;

(9) Transistor category: Bidirectional Thyristor (TRIAC)

Kelvin, Type_ident, Qs_chk, Pin_test, Igt, Vgt, Vtm, Vdrm, Vrrm, Vdrm rrm, Irrm, Idrm, Irrm_drm, Ih, IL, C_vtm, △Vdrm, △Vrrm, △Vtm;

(10) Transistor category: Unidirectional Thyristor (SCR)

Kelvin, Type_ident, Qs_chk, Pin test, lgt, Vgt, Vtm, Vdrm Vrrm, IH, IL, △Vdrm△Vrrm, Vtm;

(11) Transistor category: MOSFET

Kelvin, Type_ident, Pin_test, VGS(th), V(BR)Dss, Rds(on), Bvds_rz, △Bvds, Gfs, Igss, ldss, Idss zero, Vds(on), Vsd, Ciss, Coss, Crss, Bvgs, ld_lim, Heater, Value_proces, △Rds(on);

(12) Transistor category: Dual MOSFET

Kelvin, Pin_chk, Type_ident, Vgs1(th), VGs2(th), VBR)Dss1, VBR)Dss2, Rds1(on), Rds2(on), Bvds1 rz, Bvds2_rz, Gfs1, Gfs2, lgss1, lgss2, Idss1, Idss2, Vsd1, Vsd2, Ciss, Coss, Crss;

(13) Transistor category: JFET

Kelvin, VGS(off), V(BR)Dss, Rds(on), Bvds_rz, Gfs, lgss, Idss(off), Idss(on), vds(on), Vsd, Ciss, Crss, Coss;

(14) Transistor category: IGBT

Kelvin, VGE(th), V(BR)CES, Vce(on), Gfe, lges, lces, Vf, Ciss, Coss, Crss;

(15) Transistor category: Three-terminal Switch Power Driver

Kelvin, Vbb(AZ), Von(CL), Rson, Ibb(off), Il(lim), Coss, Fun_pin_volt;

(16) Transistor category: Seven-terminal Half-Bridge Driver

Kelvin, lvs(off), lvs(on), Rson_h, Rson_l, lin, Iinh, ls_Volt, Sr_volt;

(17) Transistor category: High-Side Power Switch

Kelvin, Vbb(AZ), Von(CL), Rson, Ibb(off), ll(Iim), Coss, Fun_pin_volt;

(18) Protection category: Varistor

Kelvin, Vrrm, Vdrm, Irrm, Idrm, Cka, △Vr;

(19) Protection category: Single-Group Voltage Protector

Kelvin, Vrrm, Vdrm, Irrm, Idrm, Cka, △Vr;

(20) Protection category: Dual-Group Voltage Protector

Kelvin, Vrrm, Vdrm, Irrm, Idrm, Cka, △Vr;

(21) Voltage Regulator Integrated category: Three-terminal Voltage Regulator

Kelvin, Type_ident, Treg_ix_chk, Vout, Reg_Line, Reg_Load, IB, IB_I, Roz, △IB, VD, ISC, Max_lo, Ro, Ext _Sw,;

(22) Voltage Regulator Integrated category: Reference IC (TL431)

Kelvin, Vref, △Vref, lref, Imin, loff, Zka, Vka;

(23) Voltage Regulator Integrated category: Four-terminal Voltage Regulator

Kelvin, Type_ident, Treg_ix_chk, Vout, Reg_Line, Reg_Load, IB, IB_I, Roz, △lB, VD, Isc, Max_lo, Ro, Ext_Sw,;

(24) Voltage Regulator Integrated category: Switching Regulator Integrated Circuit

Optional;

(25) Relay category: 4-pin Single Pole Single Throw (SPST), 5-pin Single Pole Double Throw (SPDT), 8-pin Double Pole Double Throw (DPDT), 8-pin Double Pole Four Throw (DP4T), Solid State Relay

Kelvin, Pin_chk, Dip6_type_ident, Vf, Ir, Vl, Il, Ift, Ron, Ton (optional), Toff (optional);

(26) Optocoupler category: 4-pin Optocoupler, 6-pin Optocoupler, 8-pin Optocoupler, 16-pin Optocoupler

Kelvin, Pin_chk, Vf, Ir, Bvceo, Bveco, Iceo, Ctr, Vce(sat), Tr, Tf;

(27) Sensing and Monitoring category:

Current Sensors (ACS712XX series, CSNR_15XX series) (optional); Hall Devices (MT44XX series, A12XX series) (optional); Voltage Monitors (optional); Voltage Reset ICs (optional);